BIST-Based Delay-Fault Testing in FPGAs
نویسندگان
چکیده
We present the first delay-fault testing approach for Field Programmable Gate Arrays (FPGAs), applicable for on-line testing as well as for off-line manufacturing and system-level testing. Our approach is based on Built-In Self-Test (BIST), it is comprehensive, and does not require expensive external test equipment (ATE). We have successfully implemented this BIST approach for delay-fault testing on the Lattice ORCA 2C and Xilinx Spartan FPGAs.
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